JSM 2012 Home

JSM 2012 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Online Program Home

Abstract Details

Activity Number: 145
Type: Invited
Date/Time: Monday, July 30, 2012 : 10:30 AM to 12:20 PM
Sponsor: International Chinese Statistical Association
Abstract - #303755
Title: Classification of Images Based on Wavelet-Based Distance Measures
Author(s): Chung Chang*+ and Todd Ogden
Companies: National Sun Yat-sen University and Columbia University
Address: Department of Applied Mathematics, Kaohsiung, 80424, Taiwan, R. O. C.
Keywords: classification ; brain imaging ; wavelets

It is often of interest to classify subjects based on imaging data (e.g., those who respond to a treatment for depression vs. those who don't). This task is challenging in part because of the high dimensionalty (hundreds of thousands of voxels per image) and also because the images are measured with noise. We propose a wavelet-based measure that can be trained to focus on the features of the images at all scales that best discriminate between groups.

The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2012 program

2012 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.