JSM 2011 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Abstract Details

Activity Number: 358
Type: Contributed
Date/Time: Tuesday, August 2, 2011 : 10:30 AM to 12:20 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #301873
Title: Use of Image Analysis Methods in Nondestructive Evaluation
Author(s): Ye Tian*+ and William Q. Meeker and Ranjan Maitra
Companies: Iowa State University and Iowa State University and Iowa State University
Address: 1414 Snedecor Hall, Ames, IA, 50011,
Keywords: Thermography ; Ultrasonics ; Matched filter ; Probability of detection ; Signal-to-noise ratio (SNR)
Abstract:

Traditional nondestructive evaluation has been done by taking a signal response (e.g., a voltage) and mapping it into a scalar that can be used for detection decision making. Modern nondestructive evaluation techniques for flaw (e.g., a crack) detection (e.g., ultrasonics, X-ray, and thermography) have images for outputs. There is a need to develop automatic crack detection algorithms to reduce the substantial effects of human-factors variability in making crack-detection decisions. In this paper, we develop and compare several methods for mapping an image into a statistically efficient decision criterion. For example, the output of a matched filter can be evaluated with a signal-to-noise ratio (SNR) criterion. After obtaining the SNR related metrics through dynamic feature extraction, we implement a statistical algorithm to automatically detect the crack's existence or not. Similar approach can be used with other kinds of filtering. We use probability of detection to compare the different approaches.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2011 program




2011 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.