This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
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Activity Number:
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679
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Type:
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Contributed
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Date/Time:
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Thursday, August 5, 2010 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Quality and Productivity
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| Abstract - #309456 |
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Title:
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Random Contamination of Semiconductor Materials
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Author(s):
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Bernard Harris*+
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Companies:
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University of Wisconsin
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Address:
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1226 Brookwood Road, Madison, 53711-3118,
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Keywords:
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Abstract:
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This report studies the asymptotic behavior of materials subject to random insertion of contaminants. In the situation at hand, the contaminants are presumed to be boron atoms. Essentially, the material is contaminated if too many contaminating atoms are too close together. Under various assumptions about the frequency of contaminants, the asymptotic probabilties of defective materials are determined.
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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