This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
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Activity Number:
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539
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Type:
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Contributed
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Date/Time:
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Wednesday, August 4, 2010 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Quality and Productivity
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| Abstract - #309330 |
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Title:
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GLR Control Chart for Monitoring the Mean Vector of Multivariate Normal Process
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Author(s):
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Sai Wang*+
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Companies:
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Virginia Tech
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Address:
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, , 24060,
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Keywords:
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SPC ;
MEWMA ;
Shewhart ;
Quality Control ;
Likelihood Ratio
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Abstract:
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A statistical process control chart using Generalized Likelihood Ratio statistic to monitor the mean vector of a Multivariate Normal process is discussed and evaluated in this paper. Performance comparisons to other multivariate control charts are carried out through computer simulations. The parameter-free GLR chart has overall better performance in detecting a wide range of mean shifts, thus provides a favorable option to practitioners.
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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