This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

Abstract Details

Activity Number: 162
Type: Topic Contributed
Date/Time: Monday, August 2, 2010 : 10:30 AM to 12:20 PM
Sponsor: Social Statistics Section
Abstract - #308733
Title: The Occasionally High Type I Error Rate of the Mantel-Haenszel Statistic Used in Detecting Differential Item Functioning and an Empirical Bayes Solution
Author(s): Sandip Sinharay*+ and Neil J. Dorans
Companies: Educational Testing Service and Educational Testing Service
Address: MS12T Rosedale Road, Princeton, NJ, 08541, USA
Keywords: Differential item functioning ; Empirical Bayes ; Mantel-Haenszel ; Educational statistics ; psychometrics
Abstract:

The Mantel-Haenszel (MH) procedure (Mantel & Haenszel, 1959) is a popular method for estimating and testing a common two-factor association parameter in a 2x2xK table. Holland (1985) described how to use the procedure to detect differential item functioning (DIF) in educational/psychological tests. Wang, Bradlow, Wainer, and Muller (2008) showed that the MH procedure often found DIF where there was none (that is, had a high Type I error rate) for easy items. They showed that their simulation-based Bayesian procedure for DIF detection overcomes this problem. We discuss a simpler solution of the problem, the use of the empirical Bayes procedure of Zwick, Thayer, and Lewis (1999), which is computationally much simpler than the procedure of Wang et al. We show, using results from real and simulated data, that the use of the empirical Bayes procedure leads to an acceptable Type I error rate.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2010 program




2010 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.