This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

Abstract Details

Activity Number: 88
Type: Contributed
Date/Time: Sunday, August 1, 2010 : 4:00 PM to 5:50 PM
Sponsor: Section on Quality and Productivity
Abstract - #307266
Title: Process Capability Analysis Chart for a Product with Bilateral Specifications
Author(s): Jose Alberto Vargas*+ and Ruben D. Guevara
Companies: Universidad Nacional de Colombia and Universidad Nacional de Colombia
Address: Calle 69 No 5-59 Ap 704, Bogota, International, , Colombia
Keywords: Process capability indices ; Process capability plot ; Statistical Process Control
Abstract:

A multi-process performance analysis chart based on process capability indices has been developed to analyse the manufacturing performance for multiple processes, which conveys critical information regarding the departure of the process mean from the target value and process variability, and provides a guideline for capability improvement. Existing performance analysis charts usually assume normal distributions and symmetric tolerances. In this paper, we present a graphical method to evaluate the process capability of a product composed of independent multiple processes with nominal-the-best specifications and symmetric or asymmetric tolerances. The proposed chart aims to get information about the location and spread of the studied characteristics which can follow any continuous distribution.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2010 program




2010 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.