This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
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Activity Number:
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475
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Type:
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Contributed
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Date/Time:
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Wednesday, August 4, 2010 : 8:30 AM to 10:20 AM
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Sponsor:
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Section on Quality and Productivity
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| Abstract - #306635 |
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Title:
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Comparisons of Estimators of Process Standard Deviation in Constructing Shewhart Control Charts with Unequal Subgroup Sizes
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Author(s):
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Nien Fan Zhang*+ and Per Winkel
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Companies:
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National Institute of Standards and Technology and Copenhagen Trial Unit
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Address:
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Stop 8980, 100 Bureau Dr, Gaithersburg, MD, 20899,
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Keywords:
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Biased estimator ;
control limit ;
linear combination ;
minimum variance ;
relative difference
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Abstract:
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The Xbar and S control charts with unequal subgroup sizes have been discussed in the literature and used in practice. Several estimators of the process standard deviation based on sample standard deviations have been proposed in constructing the charts. We discuss the properties of these estimators and make comparisons using the criterion of minimum mean squared error. Shewhart charts based on the recommended estimator of the process standard deviation are also discussed
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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