This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
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Activity Number:
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213
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Type:
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Invited
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Date/Time:
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Monday, August 2, 2010 : 2:00 PM to 3:50 PM
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Sponsor:
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IMS
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| Abstract - #306158 |
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Title:
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Statistical Work in Nano-Material Research
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Author(s):
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C.F. Jeff Wu*+
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Companies:
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Georgia Institute of Technology
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Address:
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765 Ferst Dr. ISYE, Atlanta , GA, 30332-0205,
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Keywords:
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design of experiments ;
mechanisitc modeling ;
global optimization ;
sequential design ;
robust design
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Abstract:
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Why should statistical methods be useful for nanotechnology work? What new features of the research are due to the nano scale? This talk will give a summary of work at the nano-statistics research group at Georgia Tech. Several aspects will be considered: design of experiments, robustness of nanowire growth to process conditions, new statistical modeling to supplement nano-mechanistic modeling in quantifying the elasticity of nanobelts, a new global optimization algorithm motivated by the desire to conduct efficient sequential experiments for growing nanomaterials. Real experimental data in the nanomaterial research group of Z. L. Wang at GT will be used for illustration.
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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