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Activity Number: 477
Type: Contributed
Date/Time: Wednesday, August 5, 2009 : 10:30 AM to 12:20 PM
Sponsor: Business and Economic Statistics Section
Abstract - #305480
Title: Statistical Assessment of Patent Validity
Author(s): Alejandro Veen and Yasuo Amemiya*+
Companies: IBM Research and IBM T.J. Watson Research Center
Address: Statistical Analysis and Forecasting, Yorktown Heights, 10598,
Keywords: patents ; patent validity ; logistic regression
Abstract:

This study presents a statistical approach to assess the validity of patents. Patents that are carefully written and where the existence of any prior art has been thoroughly researched, will ultimately hold up in court, if challenged. This study analyzes a set of patents that where challenged in the United States Court of Appeals for the Federal Circuit since the beginning of 2003 and proposes a logistic regression approach to assess their validity.

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