JSM Preliminary Online Program
This is the preliminary program for the 2009 Joint Statistical Meetings in Washington, DC.

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Activity Number: 180
Type: Roundtables
Date/Time: Monday, August 3, 2009 : 12:30 PM to 1:50 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #305090
Title: The Many Forms of Reliability Data
Author(s): David C. Trindade*+
Companies: Sun Microsystems, Inc.
Address: 6005 Assisi Court, San Jose, CA, 95138-2316,
Keywords: survival analysis ; reliability data ; censored data ; truncated data ; interval censoring ; arbitrary censoring
Abstract:

Reliability data comes in many forms: exact times to failure or readout intervals, right censored, left censored, right truncated, left truncated, interval censored, double interval censored, arbitrary censoring, single censored, multicensored, random interval censoring, sudden access, and so on. How does one analyze the data properly? We will discuss the various types and consider the appropriate analysis techniques. The luncheon discussion is meant to be an overview to familiarize attendees with the forms reliability data takes and facilitate correct analysis.

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Revised September, 2008