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Activity Number:
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456
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Type:
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Topic Contributed
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Date/Time:
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Wednesday, August 5, 2009 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #304560 |
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Title:
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Statistical Aspects of Monitoring Time-Managed Lifetime Data
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Author(s):
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Emmanuel Yashchin*+
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Companies:
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IBM Research
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Address:
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IBM, Thomas J. Watson Research Center, Yorktown Heights, NY, 10598,
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Keywords:
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Censoring ; Reliability ; Wearout ; Weibull ; Cusum
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Abstract:
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We consider the problem of monitoring time-managed data that corresponds to a sequence of lifetime tests with censoring. In many applications (for example, monitoring of warranty data) the outcomes of the lifetime tests represent information on field reliability of various systems and sub-systems observed for consecutive manufacturing vintages. At any given moment of time, only results for a limited set of vintages are available. We assume that the parameters of the lifetime distribution undergo abrupt changes and our main objective is to develop a monitoring system for early detection of unfavorable changes. In this paper we present a Cusum-based approach to monitoring such type of data and discuss its application in a system for warranty data monitoring deployed in the IBM Personal Systems Division.
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
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