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Activity Number:
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516
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Type:
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Contributed
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Date/Time:
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Wednesday, August 5, 2009 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #303609 |
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Title:
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Robust Test Plans for Accelerated Degradation Experiment
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Author(s):
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Shuen-Lin Jeng*+
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Companies:
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National Cheng Kung University
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Address:
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No. 1, University Road, Tainan, International, 701, Taiwan
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Keywords:
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Robust test plan ; accelerated degradation test ; MLE ; percentile
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Abstract:
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Pascual and Montepiedra (2005) derived expressions for the asymptotic distribution of MLEs of model parameters in ALTs when the model distribution is misspecified and used the results to formulate criteria for finding robust test plans. However, no work so far discusses the robustness of ADT plans. In this study, we focus on the optimal test plans of accelerated degradation tests. The position of the lower stress of a ADT is obtained by minimizing the asymptotic variance of a particular percentile at the use-condition. The distribution considered are normal, lognormal, Weibull, Sev and Gamma. Simulation study is conducted to show the design points under various values of the distribution parameters.
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
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