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Activity Number:
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119
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Type:
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Contributed
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Date/Time:
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Monday, August 3, 2009 : 8:30 AM to 10:20 AM
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Sponsor:
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Section on Risk Analysis
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| Abstract - #303522 |
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Title:
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Accurate Two-Sided Tolerance Limits for the Normal Random Effects Model
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Author(s):
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Shun-Yi Chen*+
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Companies:
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Tamkang University
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Address:
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, Tamsui, International, 251, Taiwan
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Keywords:
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confidence levels ; variance ratio ; ß-content interval
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Abstract:
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In this article we examine a method for constructing accurate two-sided tolerance limits for the balanced one-way normal random effects model. The technique is derived by conditioning on an estimator of the unknown expected mean square ratio as in Chen and Harris (2006); their results for one-sided tolerance limits can be extended to the two-sided case. Simulation studies indicate that the present procedure is less conservative than several current existing methods and gives more accurate coverage rates. Statistical tables needed to implement the procedure are included.
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
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