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Activity Number: 431
Type: Topic Contributed
Date/Time: Wednesday, August 5, 2009 : 8:30 AM to 10:20 AM
Sponsor: IMS
Abstract - #303401
Title: A New Notion of Data Depth Based on Goodness-of-Fit Tests
Author(s): Ye Dong*+ and Stephen M.S. Lee
Companies: The University of Hong Kong and The University of Hong Kong
Address: Room 701, Lady Ho Tung Hall, Hong Kong, , China
Keywords: Data Depth ; Goodness-of-Fit Tests ; Multimodality
Abstract:

Data depth provides a natural means to rank multivariate vectors with respect to an underlying multivariate distribution. Most existing depth functions emphasize a center-outward ordering of data points, which may fail to capture other important distributional features such as multimodality of concern to certain statistical applications. Such inadequacy motivates us to develop a novel notion of data depth with emphasis on "representativeness" rather than "centrality." Derived essentially from a choice of goodness-of-fit test statistic, the new notion calls for a new interpretation of "depth" more akin to the concept of density instead of location. It copes well with multivariate data exhibiting multimodality in particular. The new definition also extends naturally to a depth measure for patterns of points as well as for singletons.


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