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Activity Number: 310
Type: Topic Contributed
Date/Time: Tuesday, August 4, 2009 : 10:30 AM to 12:20 PM
Sponsor: Section on Statistics in Defense and National Security
Abstract - #303370
Title: Adventures in Reliability Growth Modeling
Author(s): Arthur Fries*+
Companies: Institute for Defense Analyses
Address: 4850 Mark Center Drive, Alexandria, VA, 22311,
Keywords: Reliability growth ; time-to-failure ; non-homogeneous Poisson process ; binomial
Abstract:

The author recounts a history of encounters with reliability growth modeling, beginning with graduate school studies and advancing through various applications in the test and evaluation of major defense systems. Interactions with Paul Ellner, this session's honoree, are highlighted.

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