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This is the preliminary program for the 2008 Joint Statistical
Meetings in Denver, Colorado.
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The views expressed here are those of the individual authors and not necessarily those of the ASA or its board, officers, or staff. Back to main JSM 2008 Program page |
= Applied Session,
= Theme Session,
= Presenter|
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| 359 | Wed, 8/6/08, 8:30 AM - 10:20 AM | CC-105 |
| Reliability and Censored Data Analysis - Contributed - Papers | ||
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Section on Quality and Productivity, Section on Physical and Engineering Sciences |
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| Chair(s): Huaiyu Ma, GE Global Research | ||
| 8:35 AM |
Weekday Dependence in Reliability Analysis of Repairable Systems — Alexandre Zolotovitski, Sun Microsystems, Inc.; David C. Trindade, Sun Microsystems, Inc.
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| 8:50 AM |
Estimation of Percentage of Defective Items in Quality Control — Shui-Ching Chang, Overseas Chinese Institute of Technology; Tze Fen Li, Ming Dao University
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| 9:05 AM |
Mean Residual of Some Discrete Distributions — Syed A. Hossain, Rider University; Mohammad Ahsanullah, Rider University; Syed N. Kirmani, University of Northern Iowa
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| 9:20 AM |
Estimating Performance Degradation Using Intervals Between Upcrossings of a Threshold — Brock E. Osborn, GE Global Research; Thomas R. Willemain, Rensselaer Polytechnic Institute; Hui Fan, Moody's Investors Services; Pasquale Sullo, Rensselaer Polytechnic Institute
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| 9:35 AM |
A Method for Calculating Control Limits for Multiple Characteristics That Are Skewed and/or Detection Limit Censored — Robert Brill, ICL Performance Products; Thomas J. Bzik, Air Products and Chemicals, Inc.
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| 9:50 AM |
Nonparametric Test Families for Highly Censored and/or Skewed Data — Thomas J. Bzik, Air Products and Chemicals, Inc.; Robert Brill, ICL Performance Products
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| 10:05 AM |
Sequential Design for Analyses Involving Several Types of Data — Christine Anderson-Cook, Los Alamos National Laboratory; Todd Graves, Los Alamos National Laboratory; Michael Hamada, Los Alamos National Laboratory
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JSM 2008
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |