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Activity Number:
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44
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Type:
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Invited
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Date/Time:
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Sunday, August 3, 2008 : 4:00 PM to 5:50 PM
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Sponsor:
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Memorial
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| Abstract - #302718 |
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Title:
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A Statistical Approach to Quantifying the Elastic Deformation of Nanomaterials
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Author(s):
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C.F. Jeff Wu*+
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Companies:
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Georgia Institute of Technology
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Address:
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School of Industrial and Systems Engineering, Atlanta, GA, 30332,
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Keywords:
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Abstract:
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Accurate estimation of elastic modulus of certain nanomaterials like nanobelt is important in many applications. A recently proposed approach was to estimate elastic modulus from a force-deflection model based on the continuous scan of a nanobelt using an Atomic Force Microscope tip at different contact forces. However, the nanobelt may have some initial bending and it may shift or deform during measurement leading to bias in the estimation. In this work we propose a new approach "Profile adjustment and parameter estimation (PAPE) to account for these various possible errors. It can automatically detect and remove the systematic errors and thus gives a more accurate estimate of the elastic modulus. The advantages of the approach are demonstrated through the application on several data sets. (Joint work with X. Deng, R. Joseph, W. Mai, Z. L. Wang.)
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
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