|
Activity Number:
|
294
|
|
Type:
|
Contributed
|
|
Date/Time:
|
Tuesday, July 31, 2007 : 10:30 AM to 12:20 PM
|
|
Sponsor:
|
Section on Physical and Engineering Sciences
|
| Abstract - #309551 |
|
Title:
|
The Application of Statistical Process Control to Chemical Solution Stability
|
|
Author(s):
|
Jennifer Herberich*+
|
|
Companies:
|
Pratt & Whitney Rocketdyne
|
|
Address:
|
1200 Rio Vista Blvd, Palm Beach Gardens, FL, 33410,
|
|
Keywords:
|
Statistical Process Control ; SPC ; chemical solutions
|
|
Abstract:
|
Statistical Process Control (SPC) is one of the most effective methods used to achieve and assure quality parts and products. The main tool used in SPC is the control chart, which monitors process performance over time. Traditional control chart methodology assumes that process output tends to vary randomly over time around some average value. Any drifts or trends are considered unnatural to the process and will be flagged as such by the control chart. However, trends over time are likely to be natural and expected features in some chemical solutions. To avoid flagging these inherent features as unnatural to the solution, the traditional control chart methodology has been modified. This paper describes the modified methodology and how it is being applied to monitor key components in plating and cleaning solutions at Pratt & Whitney Rocketdyne in West Palm Beach, FL.
|
