JSM Preliminary Online Program
This is the preliminary program for the 2007 Joint Statistical Meetings in Salt Lake City, Utah.

The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.



Back to main JSM 2007 Program page




Activity Number: 459
Type: Topic Contributed
Date/Time: Wednesday, August 1, 2007 : 2:00 PM to 4:50 PM
Sponsor: IMS
Abstract - #309760
Title: Double Shrinkage Empirical Bayesian Confidence Intervals for Multiple Parameters When the Variances Are Unequal and Unknown
Author(s): Jing Qiu*+ and Gene J.T. Hwang and Zhigen Zhao
Companies: University of Missouri-Columbia and Cornell University and Cornell University
Address: 134I Middlebush Hall, Columbia, MO, 65211,
Keywords: Empirical Bayes ; Double shrinkage ; Multiple confidence intervals ; unequal and unknown variances ; microarray
Abstract:

In this paper we apply the empirical Bayes technique to construct confidence intervals for a large number $p$ of parameters. The present confidence intervals constructed in the literature assume that the variances $\sigma^2_i$'s are either known or equal. For the situation when variances are unequal and unknown, the suggestion is typically to replace it by an unbiased estimator $S^2_i$. However, when $p$ is large, there may be many $S^2_i$ that are extremely small and thus create many false positive results. This problem can be corrected by using shrinkage estimators. Here, we attempt to construct confidence intervals based on empirical Bayes estimators that shrink both the means and variances. Analytical and numerical studies and application to a real data show that compared to t intervals, our intervals have higher coverage probabilities while yielding shorter lengths.


  • The address information is for the authors that have a + after their name.
  • Authors who are presenting talks have a * after their name.

Back to the full JSM 2007 program

JSM 2007 For information, contact jsm@amstat.org or phone (888) 231-3473. If you have questions about the Continuing Education program, please contact the Education Department.
Revised September, 2007