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This is the preliminary program for the 2006 Joint Statistical
Meetings in Seattle, Washington.
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The views expressed here are those of the individual authors and not necessarily those of the ASA or its board, officers, or staff. Back to main JSM 2006 Program page |
= Applied Session,
= Theme Session,
= Presenter, Sheraton Seattle Hotel & Towers = “S”
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Sun, 8/6/06, 4:00 PM - 5:50 PM | CC-606 |
| Industrial Applications - Contributed - Papers | ||
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Section on Quality and Productivity, Section on Physical and Engineering Sciences |
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| Chair(s): Angela Patterson, GE Global Research | ||
| 4:05 PM |
Hierarchcial Modeling Using GLMs To Improve Yield —  Christina Mastrangelo, University of Washington; Naveen Kumar, University of Washington
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| 4:20 PM |
Sequential Analysis on Misspecified Distributions — Theresa Utlaut, Intel Corporation; Kevin Anderson, Intel Corporation
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| 4:35 PM |
Robust Analysis of Variance: Process Design and Quality Improvement — Avi Giloni, Yeshiva University; Sridhar Seshadri, New York University; Jeffrey Simonoff, New York University
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| 4:50 PM |
Statistical Quality Control of Loadboards for Electronic Package Testers — Meihui Guo, National Sun Yat-sen University; Yu-Jung Huang, I-Shou University; Ming-Kun Chen, I-Shou University
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| 5:05 PM |
Statistical Monitoring of Multistage Processes — Fugee Tsung, The Hong Kong University of Science and Technology
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| 5:20 PM |
Stochastic Models for Predicting Product Failure Rate of Parenterals Due to Particulate Matter — Chi-Hse Teng, Pfizer Inc.
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| 5:35 PM | Floor Discussion | |
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JSM 2006
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |