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This is the preliminary program for the 2006 Joint Statistical
Meetings in Seattle, Washington.
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The views expressed here are those of the individual authors and not necessarily those of the ASA or its board, officers, or staff. Back to main JSM 2006 Program page |
= Applied Session,
= Theme Session,
= Presenter, Sheraton Seattle Hotel & Towers = “S”
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Tue, 8/8/06, 2:00 PM - 3:50 PM | CC-620 |
| Degradation Models and Other Topics in Reliability - Contributed - Papers | ||
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Section on Physical and Engineering Sciences |
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| Chair(s): Jave Pascual, Washington State University | ||
| 2:05 PM |
A Statistical Method for Crack Detection in Thermal Acoustics Nondestructive Evaluation Data — Chunwang Gao, Iowa State University; William Q. Meeker, Jr., Iowa State University
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| 2:20 PM |
Estimation of Flaw Size Distribution Parameters under Correlated Random Censoring — Peter Hovey, University of Dayton; Alan Berens, Retired
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| 2:35 PM |
Modeling Unit Degradation from Exceedance Time Data — Hui Fan, Rensselaer Polytechnic Institute; Brock Osborn, GE Global Research; Thomas R. Willemain, Rensselaer Polytechnic Institute; Pasquale Sullo, Rensselaer Polytechnic Institute
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| 2:50 PM |
A Discrete Degradation Model for Ultra-Thin Gate Oxide Data — Shuen-Lin Jeng, Tunghai University; Min-Hsiung Hsien, Tunghai University
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| 3:05 PM |
Bayesian Degradation Modeling with Covariate-Dependent Box-Cox Transformation of the Response Variable — Fridtjof Thomas, VTI; Arzu Onar, St. Jude Children's Research Hospital; Bouzid Choubane, Florida Department of Transportation; Tom Byron, Florida Department of Transportation
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| 3:20 PM |
Recurrent Events: Modeling and Inference — Edsel A. Peña, University of South Carolina
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| 3:35 PM | Floor Discussion | |
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JSM 2006
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |