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This is the preliminary program for the 2006 Joint Statistical
Meetings in Seattle, Washington.
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The views expressed here are those of the individual authors and not necessarily those of the ASA or its board, officers, or staff. Back to main JSM 2006 Program page |
= Applied Session,
= Theme Session,
= Presenter, Sheraton Seattle Hotel & Towers = “S”
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Mon, 8/7/06, 8:30 AM - 10:20 AM | CC-616 |
| Process Monitoring - Contributed - Papers | ||
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Section on Quality and Productivity, Section on Physical and Engineering Sciences |
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| Chair(s): William H. Woodall, Virginia Polytechnic Institute and State University | ||
| 8:35 AM |
Monitoring in the Presence of Dynamically Changing Observations —  Emmanuel Yashchin, IBM Research
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| 8:50 AM |
Statistical Monitoring of Heteroscedastic Dose-Response Profiles from High-Throughput Screening — James D. Williams, GE Global Research; Jeffrey B. Birch, Virginia Polytechnic Institute and State University; William H. Woodall, Virginia Polytechnic Institute and State University; Nancy Ferry, DuPont Crop Protection
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| 9:05 AM |
Profile Monitoring via Linear Mixed Models — Willis Jensen, W. L. Gore & Associates, Inc.; Jeffrey B. Birch, Virginia Polytechnic Institute and State University; William H. Woodall, Virginia Polytechnic Institute and State University
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| 9:20 AM |
Monitoring of the Process Mean with Double Sampling EWMA Control Charts — Keunpyo Kim, PRA International; Marion R. Reynolds, Jr., Virginia Polytechnic Institute and State University
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| 9:35 AM |
Estimation of Process Parameters To Determine the Optimum Diagnosis Interval for Control of Defective Items — Abhyuday Mandal, University of Georgia; Tirthankar Dasgupta, Georgia Institute of Technology
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| 9:50 AM | Floor Discussion | |
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JSM 2006
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |