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Activity Number:
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421
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Type:
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Contributed
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Date/Time:
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Wednesday, August 9, 2006 : 10:30 AM to 12:20 PM
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Sponsor:
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Biometrics Section
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| Abstract - #307471 |
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Title:
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A Statistical Approach for Genome-Wide Scan and Testing Imprinted Quantitative Trait Loci
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Author(s):
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Yuehua Cui*+
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Companies:
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Michigan State University
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Address:
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A411 Wells Hall, East Lansing, MI, 48824,
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Keywords:
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EM algorithm ; genomic imprinting ; maximum likelihood ; imprinted quantitative trait loci ; reciprocal backcross
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Abstract:
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Nonequivalent expression of alleles at a locus results in genomic imprinting. In this article, a statistical approach for genome-wide scan and testing imprinted quantitative trait loci (iQTL) underlying complex traits based on experimental crosses of inbred line species is developed. The genetic design is based on two reciprocal backcrosses. The proposed approach models genomic imprinting by considering imprinting as a probability measure. Simulation results shows that our model is very robust for identifying iQTL with various degree of imprinting ranging from no imprinting, partial imprinting to complete imprinting. Under various simulation scenarios, the model shows consistent parameter estimation with reasonable precision and high power in testing iQTL. The developed model provides a testable framework for testing and estimating iQTL involved in the genetic control of complex traits.
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- The address information is for the authors that have a + after their name.
- Authors who are presenting talks have a * after their name.
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