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This is the preliminary program for the 2006 Joint Statistical Meetings in Seattle, Washington.

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Activity Number: 474
Type: Contributed
Date/Time: Wednesday, August 9, 2006 : 2:00 PM to 3:50 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #306956
Title: Representations of Spatial Surface Models
Author(s): James Yen*+
Companies: National Institute of Standards and Technology
Address: 100 Bureau Drive, Gaithersburg, MD, 20899-8980,
Keywords: shape and surface estimation ; uncertainty estimation ; hierarchical model ; mapping
Abstract:

The laser detection and ranging (LADAR) device, atomic force microscope (AFM), interferometer, coordinate measuring machine (CMM), and geometry measuring machine (GEMM) are all modern instruments that can measure the form of surfaces and objects. While these instruments can produce measurements with precisions ranging from nanometers to centimeters, they all face questions associated with quantifying the uncertainty of those measurements. In particular, topics may include registration and stitching of measurements into a coherent whole, modeling for uncertainty components, and visual representation of the measurements and models.

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Revised April, 2006