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Activity Number: 67
Type: Contributed
Date/Time: Sunday, August 6, 2006 : 4:00 PM to 5:50 PM
Sponsor: Section on Quality and Productivity
Abstract - #306679
Title: Statistical Quality Control of Loadboards for Electronic Package Testers
Author(s): Meihui Guo*+ and Yu-Jung Huang and Ming-Kun Chen
Companies: National Sun Yat-sen University and I-Shou University and I-Shou University
Address: Department of Applied Math, Kaohsiung, 804, Taiwan
Keywords: statistical quality control ; loadboard ; lifetime ; preventive maintenance
Abstract:

Each packaged IC undergoes a rigorous process of electrical / electronics testing to assure the quality of the finished products before shipping to the manufacturer as well as the customer. These electrical testing machines were composed of the machine tester, test interface unit, and the handler. The TIU, which is mainly composed of the loadboards, provides the electrical and mechanical connection of the device under test and the tester. In this work, we perform statistical quality control of loadboards for electronic package testers. In particular, counts of failure and lifetime of loadboards are studied. Control charts of mean time between failure are established. Optimal preventive maintenance schedule of planned maintenance actions is then proposed to aim at the prevention of breakdowns and failures. The ideal preventive maintenance program would enable more accurate and effective


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