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Activity Number:
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75
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Type:
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Contributed
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Date/Time:
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Sunday, August 6, 2006 : 4:00 PM to 5:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #306496 |
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Title:
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An Application of Accelerated Lifetime Design/Analysis for Estimating the Lifetime of CDs and DVDs
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Author(s):
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James J. Filliben*+ and Adriana Hornikova and Frederick R. Byers
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Companies:
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National Institute of Standards and Technology and National Institute of Standards and Technology and National Institute of Standards and Technology
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Address:
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100 Bureau Drive, Gaithersburg, MD, 20899-8980,
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Keywords:
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accelerated lifetime testing ; simulation ; uncertainty ; Eyring model ; design of experiment
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Abstract:
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The durability and lifetime of storage media such as CDs and DVDs was investigated utilizing an accelerated testing experiment. An optimally designed experiment was determined to minimize the bias and uncertainty of the predicted median lifetime at ambient conditions. This approach will apply for different CD and DVD manufactures and types. The ISO 18 927 and ANSI standards specify five different stress conditions in conjunction with the Eyring model, for predicting the ambient life expectancy of CDs and DVDs. For variance stabilization we used the logarithm of the failure times for the least squares regression fit to predict failure at ambient conditions. A simulation was carried out to determine the optimal accelerated testing design for this study, and to determine the lifetime estimates (and uncertainty) at ambient.
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