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Activity Number:
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91
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Type:
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Invited
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Date/Time:
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Monday, August 7, 2006 : 8:30 AM to 10:20 AM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #305084 |
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Title:
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Degradation-Based Models for Analyzing Repairable Systems
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Author(s):
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Vijay Nair*+ and Anupap Somboonsavatdee and Ananda Sen
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Companies:
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University of Michigan and University of Michigan and University of Michigan
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Address:
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Department of Statistics, Ann Arborm, MI, 48109-1107,
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Keywords:
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reliability
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Abstract:
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The nonhomogeneous Poisson process (NHPP) is perhaps the most commonly used model for analyzing failure data on repairable systems. In this talk, we describe an analogous model for analyzing degradation data from repairable systems based on nonhomogeneous Gaussian processes. Extensions to nonhomogeneous Levy processes will be mentioned. Just as the NHPP can handle different types of intensity functions, these processes can accommodate a variety of degradation rates. Different types of imperfect repair and aging of the system and environment also can be incorporated. Both nonparametric and parametric inference will be described.
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