JSM 2005 Online Program

Abstract #304356

This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Activity Number:	520
Type:	Contributed
Date/Time:	Thursday, August 11, 2005 : 10:30 AM to 12:20 PM
Sponsor:	General Methodology
Abstract - #304356
Title:	Interchangeable Measurements in Gaussian and Multinomial Graphical Models
Author(s):	Henk Kelderman*+
Companies:	Free University Amsterdam
Address:	FPP AenO, Amsterdam, 1081BT, Netherlands
Keywords:	Exchangeability ; Factor analysis ; Latent trait model ; Scale type
Abstract:	Within graphical models, multiple measures for the same attribute often occur. We propose interchangeability as a general principle to generate measurement models for these measures. Interchangeability requires that, after some admissible bijective scale transformations, measures for the same attribute have the same pattern of associations to other variables within the graph. The constraints on the canonical parameters of Gaussian and multinomial distributions are studied. It is shown that the one-factor model implies the same data structure as a Gaussian interchangeability model for linear admissible transformations and the conditional polytomous Rasch model implies the same data structure as the multinomial interchangeability model for scale transformations, giving category scores that are invariant over measures. These latent trait representations are not unique though, and interchangeability models do not need them.

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