JSM 2005 - Toronto

Abstract #304043

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 125
Type: Topic Contributed
Date/Time: Monday, August 8, 2005 : 10:30 AM to 12:20 PM
Sponsor: Section on Quality and Productivity
Abstract - #304043
Title: Residual Estimation for the Analysis of Dispersion Effects in Unreplicated Two-level Fractional Factorial Split-plot Designs
Author(s): Andre L. Pinho*+ and Carla A. Vivacqua and Soren Bisgaard and Harold J. Steudel
Companies: Universidade Federal do Rio Grande do Norte and Universidade Federal do Rio Grande do Norte and University of Massachusetts and University of Wisconsin, Madison
Address: Rua da Lagosta 466 Apt 3002B, Natal RN, International, 59090-500, Brazil
Keywords: dispersion effect ; fractional factorial ; quality improvement
Abstract:

Recently, the application of split-plot designs in industrial settings has become a common and widespread practice in the study and improvement of processes and systems. Unfortunately, little attention has been given to the estimation and analysis of residuals in unreplicated split-plot plans. In this paper, we provide a framework to study the residuals of unreplicated two-level fractional factorial split-plot designs. Among all the features that can be studied, we give special attention to the study of dispersion effects. Before estimating the residuals, we need to identify an adequate location model. Based on this location model, we employ a two-step residual estimation procedure. One step deals with the estimation of the whole plot (WP) residuals and the other deals with the subplot (SP) residuals. We illustrate the application of the method with an experiment conducted at the Engineering Research Center for Plasma at the University of Wisconsin-Madison with the intention of improving the plasma treatment on paper.

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