JSM 2005 - Toronto

Abstract #303941

This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 154
Type: Luncheons
Date/Time: Monday, August 8, 2005 : 12:30 PM to 1:50 PM
Sponsor: Section on Quality and Productivity
Abstract - #303941
Title: Statistics in Nanotechnology
Author(s): J. C. Lu*+
Companies: Georgia Institute of Technology
Address: 755 Ferst Drive NW, Atlanta, GA, 30332-0205, United States
Keywords: nano-technology ; degradation studies
Abstract:

Nanotechnology has become popular in many fields, including medical and sensor research. Statistics also has a role in these new and exciting fields. For example, timely processing of a large volume of online product-monitoring measurements is needed for controlling the Chemical Mechanical Polishing (CMP) process critical in manufacturing nanoscale devices. Degradation studies of nanoscale products will allow us to understand failure behavior and product reliability. This roundtable luncheon discussion intends to explore future research opportunities in nanotechnology-related research areas.

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Revised March 2005