JSM 2005 Online Program

Abstract #303938

This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Activity Number:	128
Type:	Topic Contributed
Date/Time:	Monday, August 8, 2005 : 10:30 AM to 12:20 PM
Sponsor:	Section on Physical and Engineering Sciences
Abstract - #303938
Title:	Engineering Physics-based Degradation Models
Author(s):	J. C. Lu*+ and Shuen-Lin Jeng and P. Papush
Companies:	Georgia Institute of Technology and Tunghai University and Georgia Institute of Technology
Address:	755 Ferst Drive NW, Atlanta, GA, 30332-0205, United States
Keywords:	engineering physical model ; differential equations ; degradation
Abstract:	Engineering physical models such as chemical kinetics provide underlying mechanisms on how materials or products degrade over time. Many such models are given in deterministic differential equations. This presentation explores possible uncertainties in manufacturing or experimentation processes and ways to structure these uncertainties in engineering models. Taylor expansion is employed to approximate the nonlinear differential equations into linear forms. By integrating these linear forms, we obtain the commonly seen degradation models in the reliability literature for deriving failure-time distributions. Numerical illustrations taken from real-life examples show the potential of this approach for constructing physics-based failure time distributions in product and process reliability studies.

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