JSM 2005 - Toronto

Abstract #303778

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 489
Type: Contributed
Date/Time: Thursday, August 11, 2005 : 8:30 AM to 10:20 AM
Sponsor: General Methodology
Abstract - #303778
Title: Linear and Loglinear Models Based on Generalized Inverse Sampling Scheme
Author(s): Soumi Lahiri*+ and Sunil K. Dhar
Companies: New Jersey Institute of Technology and New Jersey Institute of Technology
Address: , Newark, NJ, 07102, United States
Keywords: linear and log-linear model ; Extended negative multinomial distribution ; maximum likelihood ; likelihood ratio test ; Wald test ; minimum chi-square estimation
Abstract:

This paper explores the linear and loglinear models based on generalized inverse sampling scheme broadly used in research of medical, biological, and environmental sciences and in random digit dialing (RDD), which is demonstrated through an example. We obtain the estimators (maximum likelihood and minimum chi-square) of the model parameters. Based on likelihood ratio test and Wald test, the model efficiency can be evaluated.

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