JSM 2005 - Toronto

Abstract #303539

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Activity Number: 128
Type: Topic Contributed
Date/Time: Monday, August 8, 2005 : 10:30 AM to 12:20 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #303539
Title: Toward Unit-specific Degradation Modeling
Author(s): Brock Osborn and Hui Fan*+ and Thomas Willemain and Pasquale Sullo
Companies: GE Global Research and Rensselaer Polytechnic Institute and Rensselaer Polytechnic Institute and Rensselaer Polytechnic Institute
Address: DSES 5207 CII, Troy, NY, 12180,
Keywords: reliability ; degradation ; sensor
Abstract:

Reliability degradation modeling in complex systems (e.g., aircraft engines, power generators, locomotives, automobiles, etc.) can now be carried out at the level of the individual unit using operating data from strategically located sensors. The challenges involved in analyzing this data consist not only in modeling the relationship between these diagnostic variables and system and/or part degradation, but also in predicting how these diagnostic variables will evolve over time in future uses of the system. In this paper, we will discuss the results of a GE- RPI joint research project exploring this problem.

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Revised March 2005