JSM 2005 - Toronto

Abstract #302431

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 299
Type: Invited
Date/Time: Tuesday, August 9, 2005 : 2:00 PM to 3:50 PM
Sponsor: Section on Nonparametric Statistics
Abstract - #302431
Title: Algorithms for Nonparametric Inference on Shape Manifolds
Author(s): Victor Patrangenaru*+ and Ananda Bandulasiri
Companies: Texas Tech University and Texas Tech University
Address: Department of Mathematics and Statistics, Lubbock, TX, 79409-1042,
Keywords: image analysis ; pattern recognition ; studentized extrinsic means ; shape analysis ; nonparametric bootstrap ; eigenanalysis
Abstract:

Data analysis on shape manifolds is a study of finite configurations of points modulo certain groups of transformations related to the way the images are recorded in machine vision. For example, if two planar images of one scene are obtained using a pinhole camera, the corresponding transformation is the composition of two central projections, which is a projective transformation. If the two central projections can be approximated by parallel projections, which is the case of remote views of the same planar scene, the projective transformation can be approximated by an affine transformation. Moreover, if these parallel projections are orthogonal projections on the plane of the camera, this affine transformation can be further approximated by a similarity transformation. Planar shape manifolds admit Veronese-Whitney (VW) representations in spaces of symmetric matrices, which allows defining VW-means and VW-covariance matrices of populations of planar shapes. In this talk, we will present computational algorithms for recently designed nonparametric statistics used in inference and testing for VW-means on shape manifolds that arise in high-level image analysis.


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Revised March 2005