JSM 2005 Online Program

Abstract #302401

This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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= Applied Session,

= Theme Session,

= Presenter

Activity Number:	423
Type:	Invited
Date/Time:	Wednesday, August 10, 2005 : 2:00 PM to 3:50 PM
Sponsor:	Biometrics Section
Abstract - #302401
Title:	Reliability as a Statistical Topic: The Impact of Joseph L. Fleiss on Studies of Medical and Psychiatric Diagnosis
Author(s):	Patrick E. Shrout*+
Companies:	New York University
Address:	6 Washington Place #308, New York, NY, 10003, United States
Keywords:	Reliability ; psychiatry ; history ; kappa ; Fleiss
Abstract:	A major development of the last half of the 20th century was the recognition that expert diagnosis could be affected by the expert selected as much as by the patient assessed. In psychiatry, the confrontation of diagnostic unreliability led to a complete revamping of the Diagnostic and Statistical Manual (DSM) in the third edition (DSM-III and DSM-IIIR). Joseph L. Fleiss was an influential biostatistician in this process, and he helped provide critical statistical tools for the study of reliability of psychiatric diagnoses. In this talk, I review a number of his contributions to the understanding of reliability as a meaningful parameter, rather than as an informal index. These contributions include descriptions of sampling distributions, methods for establishing confidence intervals, development of innovative reliability study design, and clear didactic writing that made the results available to a wide audience. I also examine some of the more recent biostatistical contributions to reliability theory in the light of the themes Fleiss described 35 years ago.

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