JSM 2005 - Toronto

Abstract #304533

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 441
Type: Topic Contributed
Date/Time: Wednesday, August 10, 2005 : 2:00 PM to 3:50 PM
Sponsor: Section on Bayesian Statistical Science
Abstract - #304533
Title: Recurrent Event Modeling and Analysis
Author(s): Edsel Pena*+ and Jun Han and Elizabeth Slate
Companies: University of South Carolina and University of South Carolina and Medical University of South Carolina
Address: Department of Statistics, Columbia, SC, 29208, United States
Keywords: Recurrent events ; Longitudinal Markers ; Repair Models
Abstract:

In this talk, I will discuss recent developments in the modeling and analysis of recurrent events. Such events arise in many scientific areas, notably in the biomedical sciences, reliability and engineering sciences, and the social sciences. A particular focus will be a general class of models that incorporates aspects of studies with recurrent events and a class of models that relates longitudinal markers and recurrent events. Methods of statistical analysis, including from a Bayesian framework, will be discussed. Finite and asymptotic properties of the procedures will be presented, and the procedures will be demonstrated through a real-data application.

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Revised March 2005