JSM 2005 - Toronto

Abstract #303745

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Legend: = Applied Session, = Theme Session, = Presenter
Activity Number: 519
Type: Contributed
Date/Time: Thursday, August 11, 2005 : 10:30 AM to 12:20 PM
Sponsor: Section on Nonparametric Statistics
Abstract - #303745
Title: A New Class of Smooth Tests of Fit for Exponential Family (Koopman-Darmois) Distributions
Author(s): Mark Inlow*+
Companies: Rose-Hulman Institute of Technology
Address: CM 143, Terre Haute, IN, 47803, United States
Keywords: goodness of fit ; lack of fit ; smooth test ; robust ; exponential family ; test
Abstract:

Various generalizations of the smooth goodness of fit test have been developed since its proposal in 1937 by Neyman. For example, Rayner and Best developed composite smooth tests with excellent properties using orthogonal polynomials. We propose a new class of smooth tests using orthogonal functions in conjunction with a new, robust estimation approach based on the moment-matching property of exponential family (Koopman-Darmois) distributions. We show that these tests compare favorably with competing tests. In particular, we demonstrate the advantages of these tests relative to current tests for the normal and exponential distributions.

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