JSM 2004 - Toronto

JSM Activity #121

This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Legend: = Applied Session, = Theme Session, = Presenter
FRY = Fairmont Royal York, ICH = InterContinental Hotel, TCC = Metro Toronto Convention Center
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121 Mon, 8/9/04, 12:00 PM - 1:50 PM TCC-Exhibit Hall E
Regular Contributed Posters - Contributed - Posters
General Methodology, Biometrics Section, Biopharmaceutical Section, Section on Bayesian Statistical Science, Section on Statistical Computing, Section on Statistics and the Environment, Section on Physical and Engineering Sciences
Chair(s): Vanja Dukic, University of Chicago
Poster Topic: Biometrics, biostatistics, epidemiology:
01: Exact Analysis of Correlated Binary Data Repeated Measures/RBD DesignDar Shong Hwang, BRSI; Chyi-Hung Hsu, Novartis Pharmaceuticals
02: Exact Analysis of Correlated Binary Response Data--Test of Treatment Effect for Parallel Group DesignDar Shong Hwang, BRSI; James S. Lee, Sankyo Pharma; Chyi-Hung Hsu, Novartis Pharmaceuticals
03: Analyzing Actual and Percentage Change as an Endpoint with or without Baseline as a Covariate in Clinical TrialsPandurang Kulkarni, Eli Lilly and Company; Yongming Qu, Eli Lilly and Company
04: Comparison of Sequential and Multistage Designs for Selecting Promising Therapeutic Modalities for Stroke in Pre-clinical ExperimentsPaula K. Roberson, University of Arkansas for Medical Sciences; William C. Culp, University of Arkansas for Medical Sciences
Poster Topic: Clinical trials, drug discovery:
05: A Bayesian Two-stage Phase II Design with Historical ControlsMichael W. Sill, Roswell Park Cancer Institute; Roger L. Priore, Roswell Park Cancer Institute
06: Checking Model Assumptions--Getting the BUGS OutSteven A. Gilbert, Rho, Inc.
07: A Comparison of a Blinded Procedure to Estimate Treatment Difference and Standard Deviation with an Unblinded Procedure in Clinical TrialsFarid Kianifard, Novartis Pharmaceuticals; Michael Chen, Novartis Pharmaceuticals
08: An Application of Cluster Analysis to a Clinical TrialKao-Tai Tsai, Aventis Pharmaceuticals
Poster Topic: General:
09: Parameter Estimation for a Proposed Joint Distribution of Correlated Bernoulli TrialsYufeng Li, University of Alabama, Birmingham; Charles R. Katholi, University of Alabama, Birmingham
Poster Topic: Pharmacokinetics and pharmacodynamics:
10: A Correlated Logistic Regression Model for Population Pharmacodynamic DataJohn Kwagyan, Howard University College of Medicine; Nnenna Kalu, Howard University College of Medicine; Robert E. Taylor, Howard University College of Medicine
Poster Topic: Bayesian statistics, hierarchical models:
11: A Bayesian Hierarchical Method for Fitting Multiple Health Endpoints in Toxicity StudiesTaeryon Choi, Carnegie Mellon University; Mark J. Schervish, Carnegie Mellon University; Ketra Schmitt, Carnegie Mellon University; Mitchell Small, Carnegie Mellon University
Poster Topic: Incomplete data analysis, imputation methods:
12: Multiple Imputation Techniques in Small Sample Clinical TrialsSunni A. Barnes, Mayo Clinic; Stacy R. Lindborg, Eli Lilly and Company; John W. Seaman, Baylor University
Poster Topic: Criminology, forensic science, judiciary statistics:
13: Toward Statistically Rigorous Biometric AuthenticationSinjini Mitra, Carnegie Mellon University
Poster Topic: Data mining and knowledge discovery, machine learning:
14: Data-mining From Different PerspectivesMorteza Marzjarani, Saginaw Valley State University
15: Regression Neural Nets and Trees for Modeling Factors Effecting Cotton YieldAndy Mauromoustakos, University of Arkansas
 

JSM 2004 For information, contact jsm@amstat.org or phone (888) 231-3473. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2004