JSM Activity #232This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions. To View the Program: You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time. |
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Legend: = Applied Session,
= Theme Session,
= Presenter FRY = Fairmont Royal York, ICH = InterContinental Hotel, TCC = Metro Toronto Convention Center |
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232 | Tue, 8/10/04, 10:30 AM - 12:20 PM | TCC-801 B |
Robustness and Mixtures - Contributed - Papers | ||
Section on Physical and Engineering Sciences | ||
Chair(s): Ashish Sanil, National Institute of Statistical Sciences | ||
10:35 AM | Simulations for Robust Tests of Many Outliers in Regression — Anthony C. Atkinson, London School of Economics | |
10:50 AM | Integration of Detailed and Quick Simulations via a Bayesian Synthesis — Zhiguang Qian, Georgia Institute of Technology; Roshan J. Vengazhiyil, Georgia Institute of Technology; C.F. Jeff Wu, Georgia Institute of Technology | |
11:05 AM | Online Changepoint Methods for Time Series — Bonnie K. Ray, IBM T. J. Watson Research Center; Hyunyoung Choi, University of Illinois, Urbana-Champaign; Hernando Ombao, University of Illinois | |
11:20 AM | Detecting Multiple Populations within a Collection of Repairable Systems — Jeffrey Glosup, Sun Microsystems Inc. | |
11:35 AM | Using Censored Data to Test the Location Parameters of Several Exponential Distributions — Jeffrey J. Green, Ball State University; Roger B. Nelson, Ball State University | |
11:50 AM | On the Use of Machine Learning in the Semiconductor Industry: Examples and Case Studies — Theresa Utlaut, Intel Corporation; Kevin Anderson, Intel Corporation | |
12:05 PM | Comparative Analysis for Artificial Neural Networks and Multiple Linear Regression for Powder Hardfacing Processes — Shu-Yi Tu, University of Michigan, Flint; Jen-Ting Wang, SUNY, Oneonta; Ming-Der Jean, Yung-Ta Institute of Technology & Commerce | |
JSM 2004
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