JSM 2004 - Toronto

JSM Activity #232

This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Legend: = Applied Session, = Theme Session, = Presenter
FRY = Fairmont Royal York, ICH = InterContinental Hotel, TCC = Metro Toronto Convention Center
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232 Tue, 8/10/04, 10:30 AM - 12:20 PM TCC-801 B
Robustness and Mixtures - Contributed - Papers
Section on Physical and Engineering Sciences
Chair(s): Ashish Sanil, National Institute of Statistical Sciences
     10:35 AM   Simulations for Robust Tests of Many Outliers in RegressionAnthony C. Atkinson, London School of Economics
     10:50 AM   Integration of Detailed and Quick Simulations via a Bayesian SynthesisZhiguang Qian, Georgia Institute of Technology; Roshan J. Vengazhiyil, Georgia Institute of Technology; C.F. Jeff Wu, Georgia Institute of Technology
     11:05 AM   Online Changepoint Methods for Time SeriesBonnie K. Ray, IBM T. J. Watson Research Center; Hyunyoung Choi, University of Illinois, Urbana-Champaign; Hernando Ombao, University of Illinois
     11:20 AM   Detecting Multiple Populations within a Collection of Repairable SystemsJeffrey Glosup, Sun Microsystems Inc.
     11:35 AM   Using Censored Data to Test the Location Parameters of Several Exponential DistributionsJeffrey J. Green, Ball State University; Roger B. Nelson, Ball State University
     11:50 AM   On the Use of Machine Learning in the Semiconductor Industry: Examples and Case StudiesTheresa Utlaut, Intel Corporation; Kevin Anderson, Intel Corporation
     12:05 PM   Comparative Analysis for Artificial Neural Networks and Multiple Linear Regression for Powder Hardfacing ProcessesShu-Yi Tu, University of Michigan, Flint; Jen-Ting Wang, SUNY, Oneonta; Ming-Der Jean, Yung-Ta Institute of Technology & Commerce
 

JSM 2004 For information, contact jsm@amstat.org or phone (888) 231-3473. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2004