JSM 2004 - Toronto

Abstract #300569

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Activity Number: 48
Type: Contributed
Date/Time: Sunday, August 8, 2004 : 4:00 PM to 5:50 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #300569
Title: An Updated Bibliography of Accelerated Test Plans
Author(s): Wayne B. Nelson*+
Companies: Wayne Nelson Statistical Consulting
Address: 739 Huntingdon Dr., Schenectady, NY, 12309,
Keywords: accelerated testing ; test plans ; bibliography ; extrapolation
Abstract:

This paper provides a current bibliography of accelerated test plans, which will aid practitioners in selecting plans and will stimulate researchers to develop needed plans. Performance of existing plans has been evaluated using analytic theory or simulation. Such plans deal with factors including: life distributions (exponential, Weibull, lognormal, etc.); different life-stress or degradation-stress relationships; types of data censoring (right and interval); types of stress loading (constant, step, ramp, cyclical, stochastic, field use); specimen size and geometry; optimization criteria (minimum variance or determinant, cost, etc.); constraints on the test region or test order of specimens; allocation of specimens to test stress levels. Many plans need to be developed, especially for degradation models. The author welcomes additions to the bibliography and on request will email a current copy as a searchable Word file (Wnconsult@aol.com).

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Revised March 2004