JSM 2004 - Toronto

Abstract #300267

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Activity Number: 288
Type: Invited
Date/Time: Wednesday, August 11, 2004 : 8:30 AM to 10:20 AM
Sponsor: WNAR
Abstract - #300267
Title: Repeated Measures Analysis: The Secondary Stochastic Processes
Author(s): Patrick J. Heagerty*+
Companies: University of Washington
Address: Box 357232, Seattle, WA, 98195,
Keywords: longitudinal data ; attrition ; time-varying covariates
Abstract:

The analysis of repeated measures requires careful attention to several secondary stochastic processes in addition to the primary response process. For example, it is well known that drop-out and stochastic time-varying covariates can require modification to standard inferential methods otherwise biased estimates will result. In addition, birth processes, death processes, treatment crossover, and measurement timing processes can impact the validity of statistical summaries. This talk will overview several of the key secondary stochastic processes and comment on validity or modification of both likelihood-based and moment-based methods of analysis when repeated measures are subject to these secondary processes.

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Revised March 2004