JSM 2004 - Toronto

Abstract #300036

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Activity Number: 92
Type: Invited
Date/Time: Monday, August 9, 2004 : 10:30 AM to 12:20 PM
Sponsor: Section on Quality and Productivity
Abstract - #300036
Title: Applying Dual Response Methodology to Robust Parameter Design for a Generalized Linear Model
Author(s): William A. Brenneman*+ and William R. Myers and Raymond H. Myers
Companies: Procter & Gamble Company and Procter & Gamble Company and Virginia Polytechnic Institute and State University
Address: 8700 Mason-Montgomery Rd., Mason, OH, 45040,
Keywords: robust parameter design ; generalized linear models ; dual response approach ; dispersion effects ; noise variables ; mesponse surface methodology
Abstract:

Robust parameter design (RPD) has been used extensively in industrial experiments, since its introduction by Genichi Taguchi. RPD has been studied and applied, in most cases, assuming a linear model under standard assumptions. More recently, RPD has been considered in a generalized linear model (GLM) setting. We apply a dual response approach when using RPD in the case of a GLM. We motivate the need for exploring both the process mean and process variance, by discussing situations when compromise between the two is necessary. Several examples are provided to further motivate the need for applying a dual response approach when applying RPD in the case of a GLM.

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