JSM 2004 - Toronto

Abstract #302034

This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

To View the Program:
You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time.

The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.


Back to main JSM 2004 Program page



Activity Number: 224
Type: Contributed
Date/Time: Tuesday, August 10, 2004 : 10:30 AM to 12:20 PM
Sponsor: Biometrics Section
Abstract - #302034
Title: Approximate Score Confidence Intervals for a Beta-binomial Proportion
Author(s): Michael E. Schuckers*+
Companies: St. Lawrence University
Address: 211 Valentine Hall, Canton, NY, 13617,
Keywords: rate estimation ; false accept ; biometric identification ; false reject
Abstract:

We consider an adjustment to the Beta-binomial proportion similar to that made by Agresti and Coull for binomial proportions. Traditional methods for making confidence intervals for a Beta-binomial proportion tend to perform poorly when the intra-individual correlation is large. In addition, the likelihood of the product Beta-binomial is not tractable for making most classic confidence intervals. To overcome this, we use an approximate score test where we substitute the estimated variance based on the likelihood function with the estimated variance of the estimator assuming the null hypothesis holds. A confidence interval is then derived by solving the resulting quadratic equation. Both the original and a simplified version are considered. We then compare these approaches to traditional interval for a Beta-binomial proportion via Monte Carlo simulation. The application that motivates this work is the estimation of false accept and false reject error rates for biometric identification devices.


  • The address information is for the authors that have a + after their name.
  • Authors who are presenting talks have a * after their name.

Back to the full JSM 2004 program

JSM 2004 For information, contact jsm@amstat.org or phone (888) 231-3473. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2004