JSM 2004 Online Program

Abstract #301327

This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

To View the Program:
You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time.

The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.

Back to main JSM 2004 Program page

Activity Number:	314
Type:	Contributed
Date/Time:	Wednesday, August 11, 2004 : 9:00 AM to 10:50 AM
Sponsor:	Section on Physical and Engineering Sciences
Abstract - #301327
Title:	The Properties of the Standard Deviation Illustrated with Engineering Data
Author(s):	D. W. McCormack, Jr.*+
Companies:	International Sematech Manufacturing Initiative
Address:	2706 Montopolis Dr., Austin, TX, 78741-6499,
Keywords:	chi distribution ; measurement error ; noncentral chi-squared distribution
Abstract:	The standard deviation is commonly used to develop metrics for engineering data. It is appealing because it expresses the measurand in its original units rather than in squared units. Unfortunately, literature on the statistical properties of the standard deviation is less prevalent than that for the variance. This presentation illustrates the development and application of frequently used properties of the standard deviation, such as its mean and variance, from the context of measuring deviations from an idealized feature on an integrated circuit.

The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2004 program