JSM Activity #50

This is the preliminary program for the 2003 Joint Statistical Meetings in San Francisco, California. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 2-5, 2003); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Legend: = Applied Session, = Theme Session, = Presenter
Hotels: H = Hilton San Francisco, R = Reniassance Parc Hotel 55, N = Nikko San Francisco
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50 Applied Session Sun, 8/3/03, 4:00 PM - 5:50 PM H-Franciscan Room C
Applications - Contributed - Papers
Section on Quality & Productivity, Section on Statistical Graphics
Chair(s): James D. Williams, Virginia Polytechnic Institute and State University
     4:05 PM   Identification of Process Parameters Under Performance Constraints — Amitava Mitra, Auburn University
     4:20 PM   Trace Plots: Do You Really Know Your Mixture? — Sarah J. Kalicin, Kraft
     4:35 PM   The Simplest Two Sample Scale Test: Count Five — Richard N. McGrath, Bowling Green State University; Bai-Yau Yeh, Bowling Green State University
     4:50 PM   Defining and Testing Equivalence in Industrial Settings — Jorge Quiroz, Wyeth Research
     5:05 PM   Analysis of Software Metrics for IT improvements — Paul A. Below, EDS
     5:20 PM   Frame Error Rate Analysis Model for the Evaluation of Advanced Photo System IX Performance — How J. Tsao, Eastman Kodak Company; Fernando G. Silva, Eastman Kodak Company
     5:35 PM   Productivity Improvement in Manufacturing Systems — Mohammad A. Quasem, Howard University
 

JSM 2003 For information, contact meetings@amstat.org or phone (703) 684-1221. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2003