JSM 2003 Online Program

Abstract #302181

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Activity Number:	133
Type:	Contributed
Date/Time:	Monday, August 4, 2003 : 12:00 PM to 1:50 PM
Sponsor:	Biometrics Section
Abstract - #302181
Title:	Estimating Correlated Binary Error Rates for Biometric Identification Devices
Author(s):	Michael E. Schuckers*+
Companies:	St. Lawrence University
Address:	7 Pine St., Canton, NY, 13617-1276,
Keywords:	biometric identification devices ; bootstrap ; Bayesian methods ; sample size ; power
Abstract:	We discuss estimation for binary repeated measures. Specifically we consider the case where binary responses are collected on n individuals m times each. Several approaches to making inferential intervals have been proposed for this problem including nonparametric and Bayesian approaches. We compare these approaches when few failures are observed paying specific attention to coverage and interval width. Discussion of the related problems of sample size and power calculations will be presented. This work is motivated by data collected on biometric identification devices such as facial recognition software and iris scanners.

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