Abstract #301394

This is the preliminary program for the 2003 Joint Statistical Meetings in San Francisco, California. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 2-5, 2003); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

To View the Program:
You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time.

The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.

Back to main JSM 2003 Program page
JSM 2003 Abstract #301394
Activity Number: 206
Type: Contributed
Date/Time: Tuesday, August 5, 2003 : 8:30 AM to 10:20 AM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #301394
Title: Theory for Accelerated Life Test Plans Robust to Misspecification of Stress-Life Relationship
Author(s): Francis G. Pascual*+
Companies: Washington State University
Address: PO Box 643113, Pullman, WA, 99164-3113,
Keywords: asymptotic bias ; asymptotic mean square error ; maximum likelihood estimation ; optimal test plan ; time failure censoring
Abstract:

This article discusses methodology for deriving the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the form of the stress-life relationship is misspecified. If the practitioner can describe possible departures from an assumed model, the results here can be used to obtain ALT plans that provide protection against potential bias and loss in efficiency. General results are derived for log location-scale distributions and time-censored data, while specific results are presented for polynomial regression and the lognormal and Weibull distributions. In a practical ALT situation, the methodology is used to derive robust test plans based on minimum asymptotic bias and minimum asymptotic mean square error. Test plans are evaluated in terms of bias, efficiency, extrapolation to use level, and expected numbers of failures.

  • The address information is for the authors that have a + after their name.
  • Authors who are presenting talks have a * after their name.

Back to the full JSM 2003 program

JSM 2003 For information, contact meetings@amstat.org or phone (703) 684-1221. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2003