Abstract #301191

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JSM 2003 Abstract #301191
Activity Number: 477
Type: Contributed
Date/Time: Thursday, August 7, 2003 : 10:30 AM to 12:20 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #301191
Title: The Analysis of Changepoint Characterizing Incomplete Burn-in in a Manufacturing Process
Author(s): Suk-Joo Bae*+ and Paul H. Kvam
Companies: Georgia Institute of Technology and Georgia Institute of Technology
Address: 328237, Ga Tech Station, Atlanta, GA, 30332-0001,
Keywords: changepoint ; burn-in ; two-phase regression ; plasma display panels ; vacuum fluorescent displays
Abstract:

Degradation modeling has a rich history in the electronics industry and other engineering fields. Frequently, degradation path of brightness for the light displays characterizes incomplete burn-in in the manufacturing process. We introduce linear model with a change-point to model the nonmonotonic degradation path. We provide an inference procedure for the parameters of change-point model and suggest the method to estimate the lifetime distribution derived from change-point model. The lifetime can be much extended by capturing change-point in the degradation path in this article. Two real examples, vacuum fluorescent displays and plasma display panels were analyzed.

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