Abstract #301607


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JSM 2002 Abstract #301607
Activity Number: 321
Type: Contributed
Date/Time: Wednesday, August 14, 2002 : 12:00 PM to 1:50 PM
Sponsor: Section on Quality & Productivity*
Abstract - #301607
Title: Determination of Optimal Measurement Guard Bands
Author(s): Youn-Min Chou*+
Affiliation(s): University of Texas, San Antonio
Address: , San Antonio, Texas, 78249,
Keywords: consumer's risk ; measurement process capability
Abstract:

Depending on the capability of the process, measurement guard bands are often applied to key characteristics of the final product. Measurement guard bands can be set within the specification limits to better assure that only conforming items are shipped to the customer. Since the final product test, such as the die shear test, may be destructive, repeated measurements on the same device are impossible. In this paper, optimal measurement guard bands are determined when the distribution of the product characteristic is unknown and each item is measured only once.


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