Abstract #301318

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JSM 2002 Abstract #301318
Activity Number: 112
Type: Contributed
Date/Time: Monday, August 12, 2002 : 12:00 PM to 1:50 PM
Sponsor: Section on Physical & Engineering Sciences*
Abstract - #301318
Title: Development Programs for One-Shot Systems Using Multiple-State Design Reliability Models
Author(s): Stephen Vardeman*+ and Suntichai Shevathusasilp
Affiliation(s): Iowa State University and Chiang Mai University
Address: 304-D Snedecor Hall, Ames, Iowa, 50010-1210, USA
Keywords: reliability growth ; optimal development program ; dynamic programming ; test cost ; simulation study ; redesign cost
Abstract:

We extend the work of Moon, Vardeman, and McBeth (1999 IEEE Transactions on Reliability) to the case of multiple-state design reliability and allow for test failure probabilities different from normal use failure probabilities. The first extension provides for more refined modeling of the evolution of a design across a development program. The second provides the possibility of accelerated testing in the development process.

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Revised March 2002